期刊
SENSORS AND ACTUATORS B-CHEMICAL
卷 148, 期 2, 页码 347-352出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.snb.2010.05.002
关键词
Nanocrystalline ZnO; AlN thin film; SAW humidity sensor; Sol-gel
资金
- Ministry of Knowledge Economy [B0009720]
- Korea Institute of Industrial Technology(KITECH) [B0009720] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
In this work, the nanocrystalline ZnO/polycrystalline (poly) aluminum nitride (AlN)/Si-layered structure was fabricated for humidity sensor applications based on surface acoustic wave (SAW). The ZnO film was used as a sensitive material layer. The ZnO and AlN films were deposited by a sol-gel process and a pulse reactive magnetron sputtering, respectively. These experimental results showed that the obtained SAW velocity on an AlN film was about 5136 m/s and 5032 m/s, corresponding to the uncoated and coated ZnO structures, respectively. For sensitive ZnO layers coated on an AlN/Si substrate, the films have a hexagonal wurtzite structure after the thin films annealed at 500 degrees C and 600 degrees C. The surface of the film exhibits sponginess and a nanometer particle size (below 50 nm). The largest shift in the frequency response was at approximately 160 kHz, the point in the relative humidity change from 10% to 90%, for the structure annealed at 500 degrees C. The effect of the ZnO layer thickness and the change in the environmental temperature on the frequency response of the SAW humidity sensor was also investigated, along with the affects from changes in the relative humidity. (C) 2010 Elsevier B.V. All rights reserved.
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