Imaging and counting threading dislocations in c-oriented epitaxial GaN layers

出版年份 2013 全文链接

标题

Imaging and counting threading dislocations in c-oriented epitaxial GaN layers

作者

关键词

-

出版物

SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Volume 28, Issue 3, Pages 035006

出版商

IOP Publishing

发表日期

2013-02-05

DOI

10.1088/0268-1242/28/3/035006

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