期刊
SCRIPTA MATERIALIA
卷 68, 期 5, 页码 245-248出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2012.10.025
关键词
Image analysis; Dual phases; Nanostructure; Local strain measurement
类别
资金
- POSCO through the Steel Science Program
- National Research Foundation of Korea
- Korea government [2010-0026981]
- National Research Foundation of Korea [2010-0026981] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
Local strain analyses in a dual phase steel were performed using a digital image correlation (DIC) method in association with Ag nanodot patterning. The optimum size of the nanodots for DIC was estimated from image error analyses. The nanodot patterning sheds light on the DIC for nanoscale local strain analysis due to its many advantages, such as high productivity, large patterning area, easy control of the dot size, and, furthermore, good adhesion. (c) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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