In situ stress relaxation and diffraction studies across the metal–insulator transition in epitaxial and polycrystalline SmNiO3 thin films

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 66, Issue 7, Pages 463-466

出版商

Elsevier BV

发表日期

2011-12-24

DOI

10.1016/j.scriptamat.2011.12.018

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