Kinetics of a retracting solid film edge: The case of high surface anisotropy

A model describing the retraction kinetics of a fully faceted edge of a single crystalline thin film deposited on a non-wetting substrate is proposed. The kinetics of retraction is very similar to that of a fully isotropic film. The calculated topography profile of the edge exhibits a single maximum and no local minima (depressions). The implications for the solid-state dewetting mechanisms are discussed. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.