期刊
SCRIPTA MATERIALIA
卷 59, 期 1, 页码 103-106出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2008.02.039
关键词
nanocrystalline metal; nickel; electroplating; atomic force microscopy; surface structure
Nanocrystalline (50-mu m-thick) Ni films with controlled surface morphology at the nanoscale were synthesized by direct-current electrodeposition of Ni on an Si substrate under different electrochemical conditions. A relationship between spatial roughness scaling and mean grain size in electrodeposited Ni was established using X-ray diffraction and atomic force microscopy. Fractal analysis showed a transition from self-affine to ultrasmooth surfaces. A non-destructive method is demonstrated to estimate the grain size distribution of ultrasmooth nanocrystalline Ni surfaces by atomic force microscopy with high-resolution probes. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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