Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope

标题
Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 4, Pages 045103
出版商
AIP Publishing
发表日期
2013-04-04
DOI
10.1063/1.4795829

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