标题
Improved controlled atmosphere high temperature scanning probe microscope
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 7, Pages 073701
出版商
AIP Publishing
发表日期
2013-07-03
DOI
10.1063/1.4811848
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- In-situ scanning photoelectron microscopy study of operating (La,Sr)FeO3-based NOx-sensing surfaces
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- Measuring individual overpotentials in an operating solid-oxide electrochemical cell
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- Electron tunneling characteristics on La0.7Sr0.3MnO3 thin-film surfaces at high temperature
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- Scanning Probe Microscopy at 650°C in Air
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- In-situ study of operating SOFC LSM/YSZ cathodes under polarization by photoelectron microscopy
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