Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials

A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 x 10(12) Omega. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4799968]