A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
出版年份 2012 全文链接
标题
A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
作者
关键词
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出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 10, Pages 103105
出版商
AIP Publishing
发表日期
2012-10-11
DOI
10.1063/1.4756691
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