How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity

标题
How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 9, Pages 093701
出版商
AIP Publishing
发表日期
2009-09-04
DOI
10.1063/1.3194048

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