Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

标题
Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 3, Pages 033708
出版商
AIP Publishing
发表日期
2008-03-20
DOI
10.1063/1.2894209

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