4.5 Article

A simple method for producing flattened atomic force microscopy tips

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REVIEW OF SCIENTIFIC INSTRUMENTS
卷 79, 期 1, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.2834875

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We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.

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