HighIon/Ioffcurrent ratio graphene field effect transistor: the role of line defect

标题
HighIon/Ioffcurrent ratio graphene field effect transistor: the role of line defect
作者
关键词
-
出版物
Beilstein Journal of Nanotechnology
Volume 6, Issue -, Pages 2062-2068
出版商
Beilstein Institut
发表日期
2015-10-23
DOI
10.3762/bjnano.6.210

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