X-ray diffraction characterization of MOVPE ZnSe films deposited on (100) GaAs using conventional and high-resolution diffractometers

标题
X-ray diffraction characterization of MOVPE ZnSe films deposited on (100) GaAs using conventional and high-resolution diffractometers
作者
关键词
-
出版物
POWDER DIFFRACTION
Volume 24, Issue 02, Pages 78-81
出版商
Cambridge University Press (CUP)
发表日期
2009-08-14
DOI
10.1154/1.3125551

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