Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene–poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry
Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene–poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry
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