Genome-Wide Association Study Reveals Novel Quantitative Trait Loci Associated with Resistance to Multiple Leaf Spot Diseases of Spring Wheat

标题
Genome-Wide Association Study Reveals Novel Quantitative Trait Loci Associated with Resistance to Multiple Leaf Spot Diseases of Spring Wheat
作者
关键词
Wheat, Quantitative trait loci, Molecular genetics, Genome-wide association studies, Leaves, Genetic loci, Chromosome mapping, Plant pathology
出版物
PLoS One
Volume 9, Issue 9, Pages e108179
出版商
Public Library of Science (PLoS)
发表日期
2014-10-01
DOI
10.1371/journal.pone.0108179

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