Electric-field-induced point defect redistribution in single-crystal TiO 2–x and effects on electrical transport

出版年份 2015 全文链接

标题

作者

关键词

Oxides, Electromigration, Point defects, Electrical properties, Analytical electron microscopy

出版物

Volume 86, Issue -, Pages 352-360

出版商

Elsevier BV

发表日期

2015-01-15

DOI

10.1016/j.actamat.2014.11.032

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