Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis

标题
Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 109, Issue 19, Pages -
出版商
American Physical Society (APS)
发表日期
2012-11-10
DOI
10.1103/physrevlett.109.196802

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