期刊
PHYSICAL REVIEW LETTERS
卷 106, 期 20, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.106.205501
关键词
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资金
- Spanish Ministry of Science and Innovation by CICYT [MAT2010-2-129-C02-01, ENE2008-04373]
- Generalitat de Catalunya [2009SGR1251]
- CICYT [CSD2007-00045, MAT2010-21270-C04-04]
- Universidad Politecnica de Valencia [UPV2010-0096]
- CONACyT Mexico [TAMU-Conacyt, J-83247-F]
- ICREA Funding Source: Custom
- Grants-in-Aid for Scientific Research [23246056] Funding Source: KAKEN
Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.
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