Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors

标题
Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 107, Issue 6, Pages -
出版商
American Physical Society (APS)
发表日期
2011-08-02
DOI
10.1103/physrevlett.107.066601

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