Application of percolation theory to microtomography of structured media: Percolation threshold, critical exponents, and upscaling

标题
Application of percolation theory to microtomography of structured media: Percolation threshold, critical exponents, and upscaling
作者
关键词
-
出版物
PHYSICAL REVIEW E
Volume 83, Issue 1, Pages -
出版商
American Physical Society (APS)
发表日期
2011-01-19
DOI
10.1103/physreve.83.016106

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