标题
Mechanism of high-resolution STM/AFM imaging with functionalized tips
作者
关键词
-
出版物
PHYSICAL REVIEW B
Volume 90, Issue 8, Pages -
出版商
American Physical Society (APS)
发表日期
2014-08-20
DOI
10.1103/physrevb.90.085421
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Sample Corrugation Affects the Apparent Bond Lengths in Atomic Force Microscopy
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