Origins of hole traps in hydrogenated nanocrystalline and amorphous silicon revealed through machine learning
出版年份 2014 全文链接
标题
Origins of hole traps in hydrogenated nanocrystalline and amorphous silicon revealed through machine learning
作者
关键词
-
出版物
PHYSICAL REVIEW B
Volume 89, Issue 11, Pages -
出版商
American Physical Society (APS)
发表日期
2014-03-11
DOI
10.1103/physrevb.89.115202
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Dangling-bond defect in a-Si:H: Characterization of network and strain effects by first-principles calculation of the EPR parameters
- (2013) G. Pfanner et al. PHYSICAL REVIEW B
- Origins of Structural Hole Traps in Hydrogenated Amorphous Silicon
- (2013) Eric Johlin et al. PHYSICAL REVIEW LETTERS
- The relationship between hydrogen and paramagnetic defects in thin film silicon irradiated with 2 MeV electrons
- (2012) O Astakhov et al. JOURNAL OF PHYSICS-CONDENSED MATTER
- Present Status and Future Prospects of Silicon Thin-Film Solar Cells
- (2011) Makoto Konagai JAPANESE JOURNAL OF APPLIED PHYSICS
- Urbach tails of amorphous silicon
- (2011) D. A. Drabold et al. PHYSICAL REVIEW B
- Large-Scale Simulations ofa-Si:H: The Origin of Midgap States Revisited
- (2011) P. A. Khomyakov et al. PHYSICAL REVIEW LETTERS
- Semiconductor solar cells: Recent progress in terrestrial applications
- (2011) V. Avrutin et al. SUPERLATTICES AND MICROSTRUCTURES
- Hydrogen distribution in the vicinity of dangling bonds in hydrogenated amorphous silicon (a-Si:H)
- (2010) M. Fehr et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Thin film silicon photovoltaics: Architectural perspectives and technological issues
- (2009) Lucia Vittoria Mercaldo et al. APPLIED ENERGY
- First-principles study of hydrogenated amorphous silicon
- (2009) K. Jarolimek et al. PHYSICAL REVIEW B
- Microscopic Description of Light Induced Defects in Amorphous Silicon Solar Cells
- (2009) Lucas K. Wagner et al. PHYSICAL REVIEW LETTERS
- Distilling Free-Form Natural Laws from Experimental Data
- (2009) Michael Schmidt et al. SCIENCE
- VESTA: a three-dimensional visualization system for electronic and structural analysis
- (2008) Koichi Momma et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Topological and topological-electronic correlations in amorphous silicon
- (2008) Yue Pan et al. JOURNAL OF NON-CRYSTALLINE SOLIDS
- Atomistic Origin of Urbach Tails in Amorphous Silicon
- (2008) Y. Pan et al. PHYSICAL REVIEW LETTERS
Create your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create NowBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started