Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

标题
Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot
作者
关键词
-
出版物
PHYSICAL REVIEW B
Volume 84, Issue 4, Pages -
出版商
American Physical Society (APS)
发表日期
2011-07-11
DOI
10.1103/physrevb.84.045307

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