期刊
PHYSICAL REVIEW B
卷 82, 期 21, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.82.214408
关键词
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资金
- BMBF [05KS1KEE/8, 03ZA6BC2]
- DFG [SFB-290 (TPA06)]
We investigated the magnetic depth profile during the transition from the ferromagnetic (FM) to the helical-antiferromagnetic (AFM) phase in Dy-metal films grown on W(110). To this purpose, we used the strongly varying photon penetration depth across the Dy M-5 absorption threshold in resonant magnetic soft x-ray diffraction. Unlike in earlier studies on Dy films with two equivalent interfaces, we find a gradual growth of the AFM part of the film with temperature. The near-surface magnetic structure does not become FM and appears to serve as seed layer for the growth of the AFM order.
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