期刊
PHYSICAL REVIEW B
卷 80, 期 5, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.80.054103
关键词
mirrors; nanostructured materials; silver; X-ray diffraction; X-ray microscopy
资金
- Specially Promoted Research [18002009]
- Young Scientists [21686060]
- Global COE Program Center of Excellence for Atomically Controlled Fabrication Technology from MEXT
- Konica Minolta Imaging Science Foundation
- Iketani Science and Technology Foundation
- Shimadzu Science Foundation
- Grants-in-Aid for Scientific Research [21686060] Funding Source: KAKEN
X-ray waves in the center of the beam waist of nearly diffraction limited focused x-ray beams can be considered to have amplitude and phase that are both almost uniform, i.e., they are x-ray plane waves. Here we report the results of an experimental demonstration of high-resolution diffraction microscopy using the x-ray plane wave of the synchrotron x-ray beam focused using Kirkpatrik-Baez mirrors. A silver nanocube with an edge length of similar to 100 nm is illuminated with the x-ray beam focused to a similar to 1 mu m spot at 12 keV. A high-contrast symmetric diffraction pattern of the nanocube is observed in the forward far field. An image of the nanocube is successfully reconstructed by an iterative phasing method and its half-period resolution is 3.0 nm. This method does not only dramatically improve the spatial resolution of x-ray microscopy but also is a key technology for realizing single-pulse diffractive imaging using x-ray free-electron lasers.
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