期刊
PHYSICAL REVIEW B
卷 80, 期 22, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.80.220101
关键词
amorphous semiconductors; annealing; Fourier transform spectroscopy; infrared spectroscopy; metastable states; self-diffusion; silicon compounds; thin films
资金
- European Commission [RII3-CT-2003-505925]
The investigation of atomic mobilities in transient metastable phases is a challenging task in diffusion science. For amorphous silicon carbonitrides we identified a transient metastable bonding configuration by Fourier-transform infrared spectroscopy on samples annealed in a defined time-temperature domain. We demonstrate that it is possible to determine nitrogen self-diffusivities in this state using neutron reflectometry. The results revealed that the diffusion experiments on this system are feasible only if very short diffusion lengths on the order of 1 nm and very low diffusivities can be measured, as it is the case for neutron reflectometry technique applied in our studies.
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