4.6 Article

Edge-type Josephson junctions in narrow thin-film strips

期刊

PHYSICAL REVIEW B
卷 78, 期 2, 页码 -

出版社

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.78.020510

关键词

-

向作者/读者索取更多资源

We study the field dependence of the maximum current I(m)(H) in narrow edge-type thin-film Josephson junctions. We calculate I(m)(H) within nonlocal Josephson electrodynamics taking into account the stray fields. These fields affect the difference of phases of the order parameter across the junction and therefore the tunneling currents. We find that the phase difference along the junction is proportional to the applied field, depends on the junction geometry, but is independent of the Josephson critical current density, i.e., it is universal. An explicit formula for this universal function is derived and used to calculate I(m)(H). It is shown that the maxima of I(m)(H)proportional to 1 root H and the zeros of I(m)(H) are equidistant only in high fields. We find that the spacing between the zeros is proportional to 1/w(2), where w is the width of the junction. The general approach is applied to calculate I(m)(H) for a superconducting quantum interference device (SQUID) with two narrow edge-type junctions.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据