Wavelet–fractal approach to surface characterization of nanocrystalline ITO thin films

标题
Wavelet–fractal approach to surface characterization of nanocrystalline ITO thin films
作者
关键词
-
出版物
PHYSICA B-CONDENSED MATTER
Volume 407, Issue 21, Pages 4369-4374
出版商
Elsevier BV
发表日期
2012-07-28
DOI
10.1016/j.physb.2012.07.036

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