期刊
PHYSICA B-CONDENSED MATTER
卷 406, 期 3, 页码 575-578出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.physb.2010.11.044
关键词
CuO; Dip coating technique; Electrical parameters; Compensation ratio
资金
- State of Planning Organization of Turkey [2001K120590]
- Ankara University [2007-07-45-054]
Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications. (C) 2010 Elsevier B.V. All rights reserved.
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