期刊
PHYSICA B-CONDENSED MATTER
卷 406, 期 20, 页码 3956-3962出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.physb.2011.07.037
关键词
Thin film; Ni-doped ZnO; Mn-doped ZnO; Sol-gel method; Photoluminescence
资金
- Creative Experimental Project of National Undergraduate Students [091067302]
- Chinese Ministry of Education [210206]
The transparent thin films of undoped, Mn-doped, and Ni-doped zinc oxide (ZnO) have been deposited on glass substrates via sol-gel technique using zinc acetate dehydrate, nickel chloride, and manganese chloride as precursors. The structural properties and morphologies of the deposited undoped and doped ZnO thin films have been investigated. X-ray diffraction (XRD) spectra, scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) were used to examine the morphology and microstructure of the thin films. Optical properties of the thin films were determined by photoluminescence (PL) and UV/vis spectroscopy. The analyzed results indicate that the obtained films are of good crystal quality and have smooth surfaces, which have a pure hexagonal wurtzite ZnO structure without any Mn or Ni related phases. The band gap energy was estimated by Tauc's method and found to be 3.28, 3.26, and 3.34 eV for ZnO, Ni-doped ZnO, and Mn-doped ZnO thin films at room temperature, respectively. Room temperature photoluminescence is observed for the ZnO, Ni-doped ZnO, and Mn-doped ZnO thin films. (C) 2011 Elsevier B.V. All rights reserved.
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