期刊
ULTRAMICROSCOPY
卷 153, 期 -, 页码 9-21出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2015.02.002
关键词
Nye tensor; Automated crystallographic orientation mapping in transmission electron microscopy (ACOM-TEM); Dislocation density; Plastic deformation
类别
资金
- United States Department of Energy Basic Energy Sciences (DOE/BES) under the Early Career program [DE-SC0008274]
- National Science Foundation's Faculty Early Career Program [1150807]
- Department of Energy's Nuclear Energy University Program [NE0000315]
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [1150807] Funding Source: National Science Foundation
The Nye tensor offers a means to estimate the geometrically necessary dislocation density of a crystalline sample based on measurements of the orientation changes within individual crystal grains. In this paper, the Nye tensor theory is applied to precession electron diffraction automated crystallographic orientation mapping (PED-ACOM) data acquired using a transmission electron microscope (TEM). The resulting dislocation density values are mapped in order to visualize the dislocation structures present in a quantitative manner. These density maps are compared with other related methods of approximating local strain dependencies in dislocation-based microstructural transitions from orientation data. The effect of acquisition parameters on density measurements is examined. By decreasing the step size and spot size during data acquisition, an increasing fraction of the dislocation content becomes accessible. Finally, the method described herein is applied to the measurement of dislocation emission during in situ annealing of Cu in IBM in order to demonstrate the utility of the technique for characterizing microstructural dynamics. (C) 2015 Elsevier By, All rights reserved.
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