Invariant pattern recognition using radon, dual-tree complex wavelet and Fourier transforms

标题
Invariant pattern recognition using radon, dual-tree complex wavelet and Fourier transforms
作者
关键词
-
出版物
PATTERN RECOGNITION
Volume 42, Issue 9, Pages 2013-2019
出版商
Elsevier BV
发表日期
2008-11-30
DOI
10.1016/j.patcog.2008.10.008

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started