Terahertz detection using spectral domain interferometry

In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the over-rotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately 8898 pi can be measured, which is 18,000 times larger than the phase difference that could be measured using EO sampling. (C) 2012 Optical Society of America