期刊
OPTICS EXPRESS
卷 21, 期 12, 页码 14430-14441出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.21.014430
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- Department of Homeland Security, Science and Technology Directorate [HSHQDC-11-C-00083]
- National Research Foundation (NRF) of Singapore through the Singapore-MIT Alliance for Research and Technology (SMART) Center for Environmental Sensing and Modeling (CENSAM)
- Chevron Energy Technology Company
- Division Of Physics
- Direct For Mathematical & Physical Scien [0959057] Funding Source: National Science Foundation
We investigate the measurement of a thin sample's optical thickness using the transport of intensity equation (TIE) and demonstrate a version of the TIE, valid for partially coherent illumination, that allows the measurement of a sample's optical path length by the removal of illumination effects. (C) 2013 Optical Society of America
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