Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry

标题
Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 20, Issue 4, Pages 4525
出版商
The Optical Society
发表日期
2012-02-10
DOI
10.1364/oe.20.004525

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