Local electrical characterization of laser-recorded phase-change marks on amorphous Ge_2Sb_2Te_5 thin films

标题
Local electrical characterization of laser-recorded phase-change marks on amorphous Ge_2Sb_2Te_5 thin films
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 19, Issue 10, Pages 9492
出版商
The Optical Society
发表日期
2011-04-30
DOI
10.1364/oe.19.009492

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started