White light interferometry for surface profiling with a colour CCD - Peeref

标题

White light interferometry for surface profiling with a colour CCD

作者

关键词

-

出版物

OPTICS AND LASERS IN ENGINEERING

Volume 50, Issue 8, Pages 1084-1088

出版商

Elsevier BV

发表日期

2012-02-25

DOI

10.1016/j.optlaseng.2012.02.002

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Protocol

Reagent

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