期刊
出版社
ELSEVIER
DOI: 10.1016/j.nima.2009.07.098
关键词
Synchrotron beamline; Dispersive EXAFS; Bi2O3; PbO; Pb5Ge3O11
A dispersive extended X-ray absorption fine structure (EXAFS) beamline employing an elliptically bent crystal and a position-sensitive CCD detector has been developed at the BL-8 bending magnet port of INDUS-2 synchrotron source at RRCAT, Indore, India. The beamline enables simultaneous measurement of X-ray absorption spectra over the range of 5-20 keV in a short span of time. The beamline performance has been investigated by measuring the absorption spectra of metal foils and oxide powders. The EXAFS measurements on crystalline Pb5Ge3O11 samples were performed for the first time in literature. The average Pb-O bond length obtained from these measurements is found to agree well with the theoretically estimated value. (C) 2009 Elsevier B.V. All rights reserved.
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