期刊
SURFACE SCIENCE
卷 631, 期 -, 页码 57-62出版社
ELSEVIER
DOI: 10.1016/j.susc.2014.07.031
关键词
Laser confocal microscopy with the differential interference microscopy (LCM-DIM); Ultraflat surfaces; Pt single crystal
资金
- Ministry of Education, Culture, Sports, Science and Technology of Japan [25286011]
- New Energy and Industrial Technology Development Organization (NEDO)
- Grants-in-Aid for Scientific Research [25286011] Funding Source: KAKEN
We recently demonstrated that improvements to our technique, laser confocal microscopy with differential interference microscopy (LCM-DIM), has rendered it fully capable of resolving monatomic steps with heights of ca. 0.25 nm on Au(111) and Pd(111) surfaces, even as low as 0.14 nm on Si(100), in aqueous solution. In this paper, we describe in detail a method to prepare and characterize, via atomic-layer-resolved LCM-DIM, ultraflat Pt(111) and Pt(100) facets over a wide surface area. The preparation of ultraflat surfaces is important in the characterization at the atomic scale of electrochemical processes under reaction conditions. To showcase the elegance of LCM-DIM, the anodic dissolution of Pt in aqueous HCl is briefly recounted. (C) 2014 Elsevier B.V. All rights reserved.
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