Carrier-envelope phase-tagged imaging of the controlled electron acceleration from SiO2 nanospheres in intense few-cycle laser fields

Waveform-controlled light fields offer the possibility of manipulating ultrafast electronic processes on sub-cycle timescales. The optical light-wave control of the collective electron motion in nanostructured materials is key to the design of electronic devices operating at up to petahertz frequencies. We have studied the directional control of the electron emission from 95 nm diameter SiO2 nanoparticles in few-cycle laser fields with a well-defined waveform. Projections of the three-dimensional (3D) electron momentum distributions were obtained via single-shot velocity-map imaging (VMI), where phase tagging allowed retrieving the laser waveform for each laser shot. The application of this technique allowed us to efficiently suppress background contributions in the data and to obtain very accurate information on the amplitude and phase of the waveform-dependent electron emission. The experimental data that are obtained for 4 fs pulses centered at 720 nm at different intensities in the range (1-4) x 10(13) W cm(-2) are compared to quasi-classical mean-field Monte-Carlo simulations. The model calculations identify electron backscattering from the nanoparticle surface in highly dynamical localized fields as the main process responsible for the energetic electron emission from the nanoparticles. The local field sensitivity of the electron emission observed in our studies can serve as a foundation for future research on propagation effects for larger particles and field-induced material changes at higher intensities.