Overview and future of single particle electron cryomicroscopy

标题

作者

关键词

Electron cryomicroscopy, CryoEM, Single particle, Amorphous ice, Radiation damage, Beam-induced movement

出版物

Volume 581, Issue -, Pages 19-24

出版商

Elsevier BV

发表日期

2015-03-26

DOI

10.1016/j.abb.2015.02.036

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