Experimental and theoretical analysis of transport properties of core–shell wire light emitting diodes probed by electron beam induced current microscopy

标题
Experimental and theoretical analysis of transport properties of core–shell wire light emitting diodes probed by electron beam induced current microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 25, Issue 25, Pages 255201
出版商
IOP Publishing
发表日期
2014-06-04
DOI
10.1088/0957-4484/25/25/255201

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