Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy

标题
Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 23, Issue 21, Pages 215703
出版商
IOP Publishing
发表日期
2012-05-03
DOI
10.1088/0957-4484/23/21/215703

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More