Characterizing the geometry of InAs nanowires using mirror electron microscopy

标题
Characterizing the geometry of InAs nanowires using mirror electron microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 23, Issue 12, Pages 125703
出版商
IOP Publishing
发表日期
2012-03-07
DOI
10.1088/0957-4484/23/12/125703

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search