期刊
NANOTECHNOLOGY
卷 23, 期 25, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/23/25/255302
关键词
-
资金
- French National Agency (ANR) [ANR-2011-EMMA-015-01]
We present a novel technique called electrical nano-imprint lithography (e-NIL) for topographic and electrostatic patterning of thermoplastic electret films at the nanometer scale. This versatile parallel process consists of simultaneously transferring micro-or nano-patterns from a conductive mold into a thermoplastic electret film and injecting positive or negative electrical charges into the bottom of the imprinted patterns. As proof of concept, we used this e-NIL process to fabricate arrays of 5 mu m and 300 nm wide topographic charged patterns into polymethylmethacrylate (PMMA) thin films coated on silicon wafers. We demonstrated that these patterned PMMA films, exhibiting thousands of topographically confined and electrostatically active sites, can be used for high-throughput directed assembly of colloidal nanoparticles.
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