Atomic-scale nanoindentation: detection and identification of single glide events in three dimensions by force microscopy

标题
Atomic-scale nanoindentation: detection and identification of single glide events in three dimensions by force microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 22, Issue 42, Pages 425703
出版商
IOP Publishing
发表日期
2011-09-21
DOI
10.1088/0957-4484/22/42/425703

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started