The role of interface thermal boundary resistance in the overall thermal conductivity of Si–Ge multilayered structures

标题
The role of interface thermal boundary resistance in the overall thermal conductivity of Si–Ge multilayered structures
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 20, Issue 36, Pages 365701
出版商
IOP Publishing
发表日期
2009-08-19
DOI
10.1088/0957-4484/20/36/365701

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