High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy

标题
High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 19, Issue 44, Pages 445717
出版商
IOP Publishing
发表日期
2008-10-03
DOI
10.1088/0957-4484/19/44/445717

向作者/读者发起求助以获取更多资源

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started